Wireless communications test

Wireless communications test equipment system integrated circuits and reference designs

Description

Wireless Communication Test Equipment (WCTE) use configurable RF frontend to test wireless devices to ensure compliance with multiple standards. Our integrated circuits and reference designs help you create a WCTE signal chain that has a high level of integration and low power as channel count increases.

    Modern wireless communication test equipment requires:

  • Direct RF sampling data converters with wide bandwidth and high dynamic range
  • Low jitter multichannel JESD204B compliant clock distribution
  • Efficient power supply that minimizes board area, and improves thermal performance
  • Low EMI power supply that improves system sensitivity and dynamic range
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Technical documentation

Application notes & user guides

Application Notes (6)

Title Type Size (KB) Date
PDF 429 KB 26 Apr 2017
PDF 261 KB 17 May 2016
PDF 82 KB 12 Jan 2016
PDF 327 KB 10 Sep 2010
PDF 166 KB 28 Feb 2005
PDF 273 KB 22 Apr 2004

Product bulletin & white papers

White Papers (5)

Title Type Size (MB) Date
PDF 4.63 MB 12 Aug 2016
PDF 3.33 MB 19 Mar 2015
PDF 1.13 MB 11 Feb 2015
PDF 91 KB 01 May 2007
PDF 342 KB 01 Feb 2004

Technical articles

Design & development

Name Part # Company Software/Tool Type
Data capture/pattern generator: data converter EVM with 16 JESD204B lanes from 1.6-15Gbps TSW14J57EVM Texas Instruments Evaluation boards
Data capture/pattern generator: data converter EVM with 8 JESD204B lanes from 0.6-12.5Gbps TSW14J56EVM Texas Instruments Evaluation boards
Data capture/pattern generator: data converter EVM with 8 JESD204B lanes from 0.6-6.5Gbps TSW14J50EVM Texas Instruments Evaluation boards

Support & training

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