Semiconductor test

Memory and Semiconductor Test Equipment integrated circuits and reference designs


Our integrated circuits and reference designs help you create high accuracy testers at wafer, package and board levels enabling dense solutions for a high number of channels while minimizing channel-to-channel variation.

    Next generation semiconductor testers often require:

  • Highest levels of speed and accuracy through data acquisition channels
  • Tight temperature controls to minimize measurement drift
  • Precise reference voltage generation to improve measurement accuracy
  • Low jitter clock distribution to maximize SNR performance
  • Highly integrated, low-height power modules minimizing board-to-board spacing
View more

Technical documentation

Application notes & user guides

Application Notes (11)

Title Type Size (KB) Date
PDF 217 KB 11 Feb 2019
PDF 107 KB 31 Aug 2018
PDF 795 KB 20 Jul 2017
PDF 78 KB 14 Jun 2017
PDF 177 KB 03 Jan 2017
PDF 261 KB 17 May 2016
PDF 132 KB 16 Apr 2015
PDF 219 KB 05 Oct 2011
PDF 327 KB 10 Sep 2010
PDF 285 KB 28 Feb 2005
PDF 125 KB 14 Jun 2004

Technical articles

Support & training

Search our extensive online knowledge base where millions of technical questions and answers are available 24/7.

Search answers from TI experts

Content is provided 'AS IS' by the respective TI and Community contributors and does not constitute TI specifications.
See terms of use.

If you have questions about quality, packaging, or ordering TI products visit our Support page.


大福彩票 天水市 永康市 成都市 商洛市 大庆市 镇江市 临夏市 阜新市 巴中市 萍乡市 崇州市 邓州市 平度市 河津市 台中市 衡水市 明光市 凤城市 吉林省 石首市 龙海市 黄石市 叶城市 都匀市 武穴市 朝阳市 青岛市 凤城市 葫芦岛市 仙桃市 合肥市 孝感市 邢台市 兴城市 平度市 利川市 洮南市 信阳市 常州市 宁国市 南阳市 徐州市 北宁市 邢台市 鹿泉市 池州市 北宁市 台中市 华阴市 延吉市 铁力市 兴城市 淮安市 汉川市 东阳市 焦作市 西安市 佛山市 潍坊市 甘肃省